ISSN 0869-6632 (Print)
ISSN 2542-1905 (Online)

атомно-силовой микроскоп

Non-contact atomic force microscope: Modeling and simulation using van der Pol averaging method

Topic and aim. One of the tools which are extremely useful and valuable for creating a topography of surfaces, measuring forces, and manipulating material with nano-meter-scale features is the Atomic force microscope (AFM). Since it can create the image of the surface object in different mediums at the nano-scale, AFM can be used in a wide variety of applications and industries. This work aimed at creating the mathematical model of the non-contact atomic force microscope. Models and Methods.